The test generation problem for analog/RF circuits has been largely intractable due to the fact that repetitive circuit simulation for test stimulus optimization is extremely time-consuming. As a consequence, it is difficult, if not impossible, to …
Post-silicon validation of RF/mixed-signal circuits is challenging due to the need to excite all possible operational modes of the DUT in order to establish equivalence between its specified and observed behaviors and to ensure that the DUT does not …