The test generation problem for analog/RF circuits has been largely intractable due to the fact that repetitive circuit simulation for test stimulus optimization is extremely time-consuming. As a consequence, it is difficult, if not impossible, to …
Due to the use of scaled technologies, high levels of integration and high speeds of today's mixed-signal SoCs, the problem of validating correct operation of the SoC under electrical bugs and that of debugging yield loss due to unmodeled …