We present a methodology for algorithmic generation of test signals for thedetection and diagnosis of a variety of short and open-circuit defects in analogcircuits. Prior algorithms have focused on test generation for known short oropen defect …
In the modern mixed-signal SoC design cycle, designers are frequently tasked with detecting and diagnosing behavioral discrepancies between design descriptions given at different levels of hierarchy, e.g. behavioral vs. transistor level descriptions …
Due to the use of scaled technologies, high levels of integration and high speeds of today's mixed-signal SoCs, the problem of validating correct operation of the SoC under electrical bugs and that of debugging yield loss due to unmodeled …