We present a methodology for algorithmic generation of test signals for thedetection and diagnosis of a variety of short and open-circuit defects in analogcircuits. Prior algorithms have focused on test generation for known short oropen defect …
The proliferation of third-party silicon manufacturing has increased the vulnerability of integrated circuits to malicious insertion of hardware for the purpose of leaking secret information or even rendering the circuits useless while deployed in …
Outsourcing of chip manufacturing to untrusted foundries and using third party IPs in design, have opened the possibility of inserting malicious hardware Trojans into the circuit. As excitation of Trojan is extremely rare, it is almost impossible to …
Insertion of malicious Trojans into outsourced chip manufacturing generally results in increased capacitances of internal circuit nodes that have been tapped for node controllability and observability by malicious circuitry. Current path delay …