The test generation problem for analog/RF circuits has been largely intractable due to the fact that repetitive circuit simulation for test stimulus optimization is extremely time-consuming. As a consequence, it is difficult, if not impossible, to …
In production testing of analog/RF ICs, application of standard specification-based tests for IC classification is not always an attractive option due to the high costs and test times involved. In this paper, a new test generation algorithm for IC …
With trends in mixed-signal systems-on-chip indicating increasingly extreme scaling of device dimensions and higher levels of integration, the tasks of both design and device validation is becoming increasingly complex. Post-silicon validation of …